2D LAYERS OF MOS2 GROWN BY THE METHOD OF PULSED LASER DEPOSITION ON GLASS AND POLYIMIDE SUBSTRATES

Abstract

We presents the results of the synthesis and studies of the properties of Mos2 monolayer and multilayer films deposited by pulsed laser deposition on glass and flexible polyimide substrates. Atomic force microscopy (AFM), X-ray diffractometry, Raman scattering spectroscopy, optical absorption, photoluminescence and Hall measurements used to characterize the structural, morphological, optical and electrical properties of the films confirm the correlation between the strain effects and properties of the films appearing due to the large mismatch between thermal expansion coefficients (TEC) of the substrate and ultrathin Mos2 layers.